Event
Seminar on the World of FIB
Wednesday, May 27, 2015
9:30 a.m.-11:00 a.m.
Kay boardrooms of the Kim Engineering Building
Martha Heil
301 405 0876
mjheil@umd.edu
http://www.nanocenter.umd.edu/events/
Two new Focused Ion Beam (FIB) instruments will accelerate the NanoCenter’s growth and ability to serve industry, principal investigators and research faculty with the latest nanoscale imaging, creation and analysis techniques.
A seminar on the new instruments’ capabilities and uses in research and manufacturing will be held May 27, 2015, from 9:30-11:00 am in the Kim 1107 & 1110.
Dr. Henri Lezec of NIST will give an overview of FIB; UMD Prof. Lourdes Salamanca-Riba will show how FIB has been used in solid oxide fuel cells; and Tescan’s product manager, Dr. Ed Principe, will explain the two new FIBs’ present and future capabilities.
An open house and demonstrations will be held in the lab after the seminar.
