Event

MSE Seminar Series: Eva Olsson

Friday, December 4, 2015
1:00 p.m.-2:00 p.m.
Zupnik Lecture Hall, Jeong H. Kim Engineering Building
JoAnne Kagle
301-405-5240
jkagle@umd.edu

NANOCOLLOQUIUM: Presented by the Maryland NanoCenter

Eva Olsson
Professor
Department of Applied Physics
Chalmers University of Technology, Gotehnburg, Sweden

In-situ electron microscopy of hard and soft matter

In situ electron microscopy allows the direct observation and correlation between material structure and properties on small scales reaching the atomic level. Examples of important mechanisms that can be studies are those of transport properties of matter and charges in complex structures and also of light induced effects and mechanical strain induced changes of charge transport properties. The direct correlation on the small scale involving individual interfaces, defects and atoms provides access to new information about which microstructural constituents that active in determining the material properties on the macro, micro, nano and atomic scale. New aspects of transport mechanisms not obvious from measurements on the macro scale can also be revealed by the high spatial resolution. The knowledge is crucial for not only the understanding of the mechanisms that are involved but also for the design or materials and devices with tailored properties. The need for high spatial resolution imaging and spectroscopy of both surfaces and internal structure can in many cases only be met by transmission electron microscopy (TEM) or a combination of electron microscopy and other techniques. TEM holders for in situ dynamic experiments and manipulation including studies of transport of charges and condensed matter further expand the dimensions of information that can be extracted. This talk will address method developments enabling studies of water interaction with soft biomaterials, electrical and thermal transport measurements and optical experiments for the study of light induced effects in scanning electron microscopes and TEMs. Different aspects of specimen geometries and electron beam effects for the correlation between structure and properties will also be discussed.

For more information, please view the event flyer.