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MSE Seminar - Dr. Richard M. Ibberson, ISIS - Rutherford Appleton Laboratory, Oxfordshire, UK
Friday, November 21, 2008
1:00 p.m.
Rm. 2108, Chemical and Nuclear Engineering Bldg.
For More Information:
Annette Mateus
301 405 5207
amateus@umd.edu

"High-Temperature Processing of Microwave Dielectric Ceramics: In Situ Studies Using Neutron and Synchrotron X-Ray Powder Diffraction"

State-of-the-art diffraction methods have been applied to study and understand the atomic-level processes and critical features of cation ordering and domain growth in commercial electroceramics in situ under processing-like conditions. High-temperature processing is crucial to the performance of these oxide materials in applications and we have developed high-resolution neutron and synchrotron X-ray powder diffraction methods to enable the key changes in the atomic scale structure to be followed at processing temperatures of up to 1500 °C and on a time scale of seconds.

In this presentation, recent examples of in situ studies on the Ba3ZnTa2O9 (BZT) and Ba3CoNb2O9 (BCN) families of materials will be discussed where the methodology was used to determine cation ordering/disordering kinetics and in the identification of different mechanisms for ordered domain growth in these materials associated with the formation of impurity phases. Future possibilities for the optimisation of the processing of new resonator materials and property control in complex oxides will also be described in light of recent and planned upgrades to powder diffractometers available at Central Facilities.

This Event is For: Public

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