Publications (recent, selected from over 150 archival publications)

S. Yang, A.Christou, “Failure Model for Silver Electromigration” IEEE Trans   Materials, Device Reliability, Vol2,  Feb 2007.

S. Yang, J.Wu, A. Christou, “Initial Stages of Silver Electrochemical Migration Degradation,” Microelectronics Reliability vol.46 (2006) 1915-1921.

C.C. Zhang, Aris Christou, “Reliability of Leadless Interconnects in GaAs ASICS”, J. of RIAC, 2006, No.2, 20-26.

Ahangir Alam, Andrei E. Botchkarev, James A. Griffin, John M. Zavada, Aristos Christou and S. Noor Mohammad, “Optical properties of MBE-grown GaAs1-xNx alloys”,
Phil Mag, 1121-1134, 2006.

L.Mohaddes-Ardahilli, L. Martinez-Miranda, L.    Salamanca-Riba, A. Christou, William Bentley and M. Al- Sheikhley, “Preferred Orientation of DNA Olionucleotide probes on the (2x4) Reconstructed Surface of (001) GaAs,” J Appl. Physics Vol 95, No. 11, Part 1 (6021-6024), June 2004.

Mohamad Al-Sheikhley, D. Sweet, Lourdes Salamanca-Riba, B. Varughese, J. Silverman, Aris Christou and William Bentley, “Radiation-Induced Failure Mechanisms of GaAs–Based Biochips,” IEEE Trans on Device and materials Reliability, vol. 4, No. 2 (192-197), June 2004.

C. Zhang, P. Yalamanchili, M. Al-Sheikhley and A. Christou, Metal Migration in Epoxy Encapsulated ECL Devices, 2004 ESREF, Oct. 2004.

L.Mohaddes-Ardahilli, L. Martinez-Miranda, J. Silverman, A. Christou, L. Salamanca- Riba and M. Al- Sheikhley, “Attachment of DNA Probes on GaAs Surfaces”, Appl. Physics Lettrs, 83, No. 1, pp. 192-194 (2003).

N. Strifas, P. Yalamanchili, A. Christou, “Reliability Model for Polyimide-Metal Interconnect Shorts,” Qual and Reliability Int. 20:1-13 (2004).

M. Linnik and A. Christou, “Calculations of optical properties for Quartenary III-V semiconductor alloys in the transparent region and above”, Physica B, 318, pp 140-161 (2002).

M. Linnik and A. Christou, “Vertical Cavity Surface Emitting Laser with GaInSbAs/AlInSbAs Bragg Mirrors for Operation at1.5µm,” IEEE Transactions on Electron dev. Vol 48, No. 10, pp. 2228-2237 (2001).

A. Christou, A Dimoulas, A. Cornet, “Epitaxial Growth Morphologies of AlAsIn/InGaAs heterostructures on non-(100) InP Index Substrates,” Materials Science and Engineering B87 pp. 249-255 (2001).

M. Linnik and A. Christou, “Optimization of III-V Compound Semiconductor Heterostructures for Distributed Bragg Reflector Applications in VCSELs,” Materials Science and Engineering B80 pp. 245-247 (2001).

M. Linnik and A. Christou, “AlGaInAs/InP and GaInSbAs/Inp Highly Reflective Mirrors for VCSEL Applications Operating at 1.55 microns”,   SPIE, vol 4278, pp 125-131 (2001).

A. Christou, “Charge Transport in Low Dimensional Nitride Semiconductor Heterostructures,” Physica B, Vol 296, No. 1-3, pp264-271 (2001).

L. Guan, A. Christou, and D. Barbe, “The Effect of Corrosion on the Performance of High Speed Multi-Chip Module Interconnects,” Quality and Reliability Engineering International, Vol. 16, pp. 1-6 (2000).

L. H. Zhu, A. Christou, and D. F. Barbe, “High Temperature Device Performance and Thermal Characteristics of GaAs MESFETs on CVD Diamond Substrates,” Quality and Reliability Engineering International Vol 16: 527-536 (2000).

T. Feng, M. Al-Sheikhly, and A. Christou, “Defect Formation in SiGe/Si Structures Grown on GaAs by CVD Techniques Utilizing a Si:H Template Layer,” Materials Science & Engineering, B67m 70-75 (1999).

N. Strifas, P. Panayotatos and A. Christou, “Optical Interconnect Reliability”, Optical Engineering (37)8, August 1998.

F. Buot, W. Anderson, A. Christou, A. Campbell and A. Knudson, “A Mechanism of Radiation-Induced Degradation”, J. Appl. Phys. 37, No. 2, pp. 581-590 (1985).

A. Christou and J. E. Davey, “Reliability and Degradation of Active III-V Semiconductor Devices”, in Reliability and Degradation, edited by D. Morgan, Wiley (1981).

A. Christou, “Amorphous Thin Film Diffusion Barriers”, in Interfaces and Contacts, edited by R. Ludeke and K. Rose, North-Holland (1983).

A. Christou, “Reliability and Radiation Effects of HEMT Integrated Circuits and Devices”, in Semiconductor Device Reliability, edited by A. Christou and B.A. Unger, Kluwer Publishing, Netherlands (1989).

For a complete list of articles, please refer to c.v.